Carrier localization of as-grown n-type gallium nitride under large hydrostatic pressure.
نویسندگان
چکیده
A quantitative study of the carrier localization in GaN under large hydrostatic pressure is presented using infrared reflection and Raman spectroscopy. The free-carrier concentration in as-grown n-type GaN crystals is determined optically from the phonon-plasmon–coupled mode and an analysis of the dielectric function. A strong decrease from 1310 cm at ambient pressure to only 3310 cm at a pressure of 27 GPa is observed. This free-carrier reduction is attributed to a strongly localized donor present at a concentration of 1310 cm and it is in agreement with previous qualitative results. From our quantitative data we determine the position of the neutral-donor level to be 12625 120 meV below the conduction band at 27 GPa. We present a model for the pressure dependence of the localized defect and predict its neutral level at 0.4060.10 eV above the conduction-band edge at ambient pressure.
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ورودعنوان ژورنال:
- Physical review. B, Condensed matter
دوره 53 3 شماره
صفحات -
تاریخ انتشار 1996